A tool for test automation with support for remote tests

Abstract

This paper presents an interactive MS-Windows ®-based tool for high-level specification and analysis of tests on printed circuit boards, using the IEEE 1149.1 standard, and also on integrated circuits using scan design like the LSSD testing methodology. As novel contributions we provide an object-oriented tool for Boundary Scan and LSSD test automation with support for remote tests, including interfaces to circuit description, chip interconnection, test vector analysis and test vector generation. The system is a reasona'.Jly complete CAE test system that includes features like remote testing (using client- server technology), project management computer-aided learning support, menu-based command entry, user-defined configuration and a comprehensive set of commands. Thus, by using this system, a test engineer or a circuit designer are able to specify and verify tests for printed circuit boards or for integrated circuits, either ocally or remotely.